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Engineering  |  FURI

Amberly Ricks

Hometown: Chandler, Arizona | Graduation Date: Spring 2021
Electrical engineering

Activation Energy Extraction of Electrodeposit Growth in Nanoionic Materials and Devices

Research Theme: Security
MORE: Spring 2020

Applied nanoionics is a field that involves the practical use of nanoionic materials and devices. The research focuses on chalcogenide-based electrolytes that support the growth of metallic dendrites. By growing the chalcogenide-based electrolyte layer between metal electrodes, the movement of metal cations can be controlled electrically. The purpose of this research is to extract the activation energy of dendrite growth in these devices. The electrodeposit growth rate across various devices will be analyzed against temperature to confirm the Arrhenius behavior, and ultimately extract the activation energy.

Other Projects

Optical Characterization of Silver-Doped Germanium-Chalcogenide Thin-films

Research Theme: Security
FURI: Spring 2019

The purpose of this research is to optically characterize germanium-based chalcogenide thin films and evaluate how their properties change when the composition is altered and when they are doped with silver. Using techniques such as UV-Vis spectroscopy, profilometry, and ellipsometry, parameters that describe the optical characteristics are found, including the absorption coefficient, refractive index, optical band gap energy, and information on the density of states. Having a better understanding of the materials’ physical properties will be useful to aid in the creation of microsystems based on these materials by selecting optimal composition and growth conditions.

Optical Characterization of Band Diagram Properties of Germanium-Chalcogenide and Silver Doped Thin-Films

Research Theme: Security
FURI: Fall 2018

The band diagram properties of germanium-chalcogenide thin films doped with silver are of interest due to their ability to become ionic conductors. Optically characterizing these thin films using UV-Visible Spectroscopy and Ellipsometry gives insight to the band diagram properties. In particular, the optical band-gap, refractive index, and absorption coefficient are the parameters that are discovered from the analysis techniques. It has been found that the optical band-gap decreases with increasing silver content. Understanding the physical properties of these thin films is the key to implementation in useful devices.

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