Hometown: Phoenix, Arizona, United States
Graduation date: Spring 2024
FURI | Spring 2023, Needs Review
Electromechanical Characterization of Nanomembrane of Soft Polymers with Nanoparticles on Rigid Substrates
Conductive Atomic Force Microscopy (CAFM), is an accurate technique to characterize material properties of the nanomembrane of soft polymers. CAFM is performed by inserting an electric current within a CAFM probe. In this research the nanomembrane of soft polymers with nanoparticles is on rigid substrates, the effect of the rigid substrate on the nanomembrane will be studied with the use of CAFM. A rigid substrate may alter the thickness, shape, and electromechanical properties of the nanomembrane. Finite element model will be created to simulate CAFM experiments on the nanomembrane of soft polymers with nanoparticles on a rigid substrate. The simulation results acquired will reinforce experimental data. The addition of a finite element model to a CAFM experiment provides an effective method to determine the electromechanical characterization of the nanomembrane. Aspects of the research that must be considered are: an upper and lower bound is necessary to study the rigid substrate and electrical and mechanical nanoscale properties differ from point to point. The researchers use CAFM in order to further the understanding of the electromechanical behavior of nanomembranes. The author provides a simulation as well as experimental analysis of the material characteristics, such as how the nanoparticle membrane reacts on rigid substrates.
Mentor: Masoud Yekani Fard