The primary objective of this research is to eliminate optical loses in perovskite silicon tandem solar cells. To understand the characteristics of the solar cell, the research required an accurate surface analysis of the thin films used. To do such, atomic force microscopy (AFM) was conducted using a scanning probe microscope. AFM uses a probe that physically taps the surface of a sample while collecting data to form images at the atomic level. In the future, other capabilities of the scanning probe microscope will be applied for further analysis.